Burn In Socket

  • Damage Free on the Device ball and PCB pad
  • High-speed testing implementation
  • 0.25P Solution available
  • Long service life and high durability
  • Customized and optimized solution
Test state
Test state
Latch open
Latch open

Exploded View

TFE Co., Ltd

(ZIP : 18384), 50-8, Banwol-gil, Hwaseoung-si, Gyeonggi-do, Korea

289-1 Yaenda, Hidaka City, Saitama, Japan (ๆ—ฅ : ใ€’350-1236 ๅŸผ็މ็œŒๆ—ฅ้ซ˜ๅธ‚็Œฟ็”ฐ๏ผ’๏ผ˜๏ผ™๏ผ๏ผ‘)


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